LayTec's 2000th in-situ tool delivered to Compound Semiconductor Centre in UK

10 November 2016

LayTec AG of Berlin, Germany says that it has delivered its 2000th in-situ metrology system since the firm's foundation in 1999. An EpiTT (with the figure 2000 in its serial number) has been shipped to Compound Semiconductor Centre (CSC) of Cardiff, Wales, UK - a joint venture formed in August 2015 between Cardiff-based epiwafer foundry and substrate maker IQE plc and Cardiff University.

CSC works on providing a complete capability value chain, from high-end R&D through product and process innovation to high value, large-scale manufacturing. "This EpiTT and other LayTec systems already installed in our labs provide unrivalled precision and sophisticated analysis algorithms, which is crucial for process optimization in semiconductor manufacturing environment," comments CSC director Dr Wyn Meredith.

"It is significant that our 2000th in-situ tool is delivered to a research institution with a strong connection to industry," says LayTec's founder & CEO Dr‚ÄČThomas Zettler. "LayTec has always set a great value on cooperating with both industry and R&D," he adds. "We have equipped hundreds of customers worldwide with state-of-the-art metrology, mainly in the field of LED and laser production. In the last few years we also entered the PV, display and advanced silicon markets. Meanwhile, our product portfolio covers all areas of process monitoring: in-situ, in-line, lab-line and map-line metrology." Due to this market diversification, Zettler believes that LayTec can deliver the next thousand tools more quickly.

Tags: LayTec Metrology EpiTT MOCVD IQE

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